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Taira, Yoshitaka*; Endo, Shunsuke; Kawamura, Shiori*; Nambu, Taro*; Okuizumi, Mao*; Shizuma, Toshiyuki*; Omer, M.; Zen, H.*; Okano, Yasuaki*; Kitaguchi, Masaaki*
Physical Review A, 107(6), p.063503_1 - 063503_10, 2023/06
Times Cited Count：0 Percentile：0.01(Optics)no abstracts in English
Endo, Shunsuke; Shizuma, Toshiyuki*; Zen, H.*; Taira, Yoshitaka*; Omer, M.; Kawamura, Shiori*; Abe, Ryota*; Okudaira, Takuya*; Kitaguchi, Masaaki*; Shimizu, Hirohiko*
UVSOR-49, P. 38, 2022/08
Sugiura, Yuki; Tomura, Tsutomu*; Ishidera, Takamitsu; Doi, Reisuke; Francisco, P. C. M.; Shiwaku, Hideaki; Kobayashi, Toru; Matsumura, Daiju; Takahashi, Yoshio*; Tachi, Yukio
Journal of Radioanalytical and Nuclear Chemistry, 324(2), p.615 - 622, 2020/05
Times Cited Count：4 Percentile：44.4(Chemistry, Analytical)Sano, Yuichi; Watanabe, So; Matsuura, Haruaki*; Nagoshi, Kohei*; Arai, Tsuyoshi*
Journal of Nuclear Science and Technology, 54(10), p.1058 - 1064, 2017/10
Times Cited Count：5 Percentile：44.07(Nuclear Science & Technology)For effective recovery of radioactive elements by adsorbents using polymer-immobilized silica (SiO
-P) supports, the microstructure of SiO-P particles impregnated with CMPO as extractants and their change with the crosslinking degree of polymer (CDP) were investigated using STXM and EXAFS analyses; further, their relation with adsorption/elution behavior was discussed. The adsorption/elution tests using adsorbents with a different CDP demonstrated that a higher CDP inhibited the elution of adsorbed metal ions from the adsorbent. The results of STXM and EXAFS analyses suggested that adsorption by CMPO proceeds through the entire area in the adsorbent and the local structure around adsorbed metal ions is similar irrespective of the CDP. Conversely, STXM analyses implied the capture of eluents such as HO by polymers with high CDP, which suppresses the prompt elution of adsorbed metal ions from the adsorbent.
Sasaki, Akira; Nishihara, Katsunobu*; Sunahara, Atsushi*; Nishikawa, Takeshi*
Proceedings of SPIE, Vol.9776, p.97762C_1 - 97762C_6, 2016/03
Times Cited Count：1 Percentile：52.7(Optics)For the improvement of efficiency and output of the laser pumped plasma (LPP) extreme ultra-violet (EUV) light source, we present a hydrodynamics model of laser irradiated Sn targets. The model takes liquid/solid to gas transition and mixed phase condition of the flow into account for the calculation of the distribution of the particles produced by the pre-pulse laser irradiation and optimization of the EUV source. Firstly, we investigate the mechanisms of the fragmentation of the target and particle emission, including the effect of the equation of state of Sn, and secondly, an applicable model is proposed based on the analysis.
Yoshida, Kensuke*; Fujioka, Shinsuke*; Higashiguchi, Takeshi*; Ugomori, Teruyuki*; Tanaka, Nozomi*; Kawasaki, Masato*; Suzuki, Yuhei*; Suzuki, Chihiro*; Tomita, Kentaro*; Hirose, Ryoichi*; et al.
Applied Physics Letters, 106(12), p.121109_1 - 121109_5, 2015/03
Times Cited Count：10 Percentile：41.17(Physics, Applied)Arita, Ren*; Nakazato, Tomoharu*; Shimizu, Toshihiko*; Yamanoi, Kohei*; Empizo, M.*; Hori, Tatsuhiro*; Fukuda, Kazuhito*; Minami, Yuki*; Sarukura, Nobuhiko*; Maruyama, Momoko; et al.
Optical Materials, 36(12), p.2012 - 2015, 2014/10
Times Cited Count：9 Percentile：45.56(Materials Science, Multidisciplinary)A single shot image of a ZnO crystal excited by the EUV laser of Kansai Photon Science Institute was captured. The evaluated EUV beam waist radii from the ZnO emission pattern along the horizontal and vertical axes are 5.0 and 4.7
m, respectively. The expected focal spot size of EUV laser and the spatial resolution of the magnifier (including the Schwarzschild objectives and lenses) are however 1 and 4m, respectively. The discrepancy on the spatial resolutions is attributed to exciton diffusion. We estimated the ZnO exciton diffusion length from the effective decay time which is shortened by exciton-exciton collision quenching and which is dependence on excitation energy density. Our results indicate that the short lifetime of ZnO is required to improve the spatial resolution.
Nankawa, Takuya; Suzuki, Yoshinori*; Ozaki, Takuo; Onuki, Toshihiko; Francis, A. J.*
Journal of Alloys and Compounds, 408-412, p.1329 - 1333, 2006/02
Times Cited Count：3 Percentile：28.59(Chemistry, Physical)We studied the biodegradation of Eu(III)-malic acid complexes by . Ten milimolar Malic acid was degraded in the absence and in the presence of Eu(III) of 0.05, 0.1, and 0.2 mM. The degradation rate of malic acid increased with decreasing the ratios of Eu(III) to malic acid. These results suggest that the toxicity of Eu(III) can be masked through its complexation with malic acid. The degradation of malic acid was followed by the production of unidentified metabolites which were associated with Eu(III). One of the unidentified organic acids was analysed to be pyruvic acid. Our findings suggest that metabolites can influence the environmental behavior of Eu(III) by biologically transformed through subsequent complexation with Eu(III).
Kato, Takako*; Murakami, Izumi*; Goto, Motoshi*; Morita, Shigeru*; Ida, Katsumi*; Peterson, B. J.*; Funaba, Hisamichi*; Nakano, Tomohide
Journal of Plasma and Fusion Research SERIES, Vol.7, p.1 - 4, 2006/00
We analyzed impurity VUV spectral emission quantitatively. Electron temperature is derived from the intensity ratio of CIII line intensities. Radiation loss sources are identified using spectroscopy and bolometer in the case of radiation collapse caused by neon gas puffing. Time dependent radiation loss of impurity ions are derived from line intensities of impurities.
Fujioka, Shinsuke*; Nishimura, Hiroaki*; Nishihara, Katsunobu*; Sasaki, Akira; Sunahara, Atsushi*; Okuno, Tomoharu*; Ueda, Nobuyoshi*; Ando, Tsuyoshi*; Tao, Y.*; Shimada, Yoshinori*; et al.
Physical Review Letters, 95(23), p.235004_1 - 235004_4, 2005/12
Times Cited Count：147 Percentile：95.57(Physics, Multidisciplinary)no abstracts in English
Masnavi, M.*; Nakajima, Mitsuo*; Sasaki, Akira; Hotta, Eiki*; Horioka, Kazuhiko*
Applied Physics Letters, 87(11), p.111502_1 - 111502_3, 2005/09
Times Cited Count：4 Percentile：17.85(Physics, Applied)no abstracts in English
Shimada, Yoshinori*; Nishimura, Hiroaki*; Nakai, Mitsuo*; Hashimoto, Kazuhisa*; Yamaura, Michiteru*; Tao, Y.*; Shigemori, Keisuke*; Okuno, Tomoharu*; Nishihara, Katsunobu*; Kawamura, Toru*; et al.
Applied Physics Letters, 86(5), p.051501_1 - 051501_3, 2005/01
Times Cited Count：113 Percentile：94.31(Physics, Applied)no abstracts in English
Sasaki, Akira; Nishihara, Katsunobu*; Murakami, Masakatsu*; Koike, Fumihiro*; Kagawa, Takashi*; Nishikawa, Takeshi*; Fujima, Kazumi*; Kawamura, Toru*; Furukawa, Hiroyuki*
Applied Physics Letters, 85(24), p.5857 - 5859, 2004/12
Times Cited Count：43 Percentile：79.97(Physics, Applied)no abstracts in English
Masnavi, M.*; Nakajima, Mitsuo*; Sasaki, Akira; Hotta, Eiki*; Horioka, Kazuhiko*
Japanese Journal of Applied Physics, 43(12), p.8285 - 8291, 2004/12
Times Cited Count：5 Percentile：23.95(Physics, Applied)no abstracts in English
Zhu, Z.; Maekawa, Yasunari; Koshikawa, Hiroshi; Suzuki, Yasuyuki; Yonezawa, Noriyuki*; Yoshida, Masaru
Nuclear Instruments and Methods in Physics Research B, 217(3), p.449 - 456, 2004/05
Times Cited Count：20 Percentile：76.47(Instruments & Instrumentation)The pretreatment effects using UV light illumination and DMF soaking on bulk and track etching rates of PET films were investigated. The wavelength of illuminated UV light plays an important role in sensitizing track etching. Illumination with the light at wavelengths longer than 320nm showed strong enhancement in the track etching rates without influence on the bulk etching rates, whereas light with the wavelengths lower than 320nm causes large enhancement in both track and bulk etching rates even in the interior of the material. The track etching rate is found to be not constant along ion tracks, which is attributed to the inhomogeneous distribution of reactive chemical species induced during post-UV light illumination. Furthermore, the DMF soaking of PET after UV light illumination can enhance the etching sensitivity of the track by more than 100 times. The phenomenon is attributed to the high diffusion of organic solution along tracks after UV light illumination.
Nishihara, Katsunobu*; Nishimura, Hiroaki*; Mochizuki, Takayasu*; Sasaki, Akira
Reza Kenkyu, 32(5), p.330 - 336, 2004/05
no abstracts in English
Fujima, Kazumi*; Nishihara, Katsunobu*; Kawamura, Toru*; Furukawa, Hiroyuki*; Kagawa, Takashi*; Koike, Fumihiro*; More, R.*; Murakami, Masakatsu*; Nishikawa, Takeshi*; Sasaki, Akira; et al.
Emerging Lithographic Technologies VIII, Proceedings of SPIE Vol.5374, p.405 - 412, 2004/00
no abstracts in English
Sugie, Tatsuo; Costley, A. E.*; Malaquias, A.*; Walker, C.*
Purazuma, Kaku Yugo Gakkai-Shi, 79(10), p.1051 - 1061, 2003/10
The main regions - the core, the edge, the scrape-off layer, and the divertor - will be probed by an extensive array of spectroscopic instrumentation covering the visible to X-ray wavelength range. Plasma parameters will be determined including impurity species/density/input-flux, ion temperature, He density, fueling ratio, plasma rotation, effective ionic charge and safety factor q. The measurements will be used for plasma control and in studies to understand and improve the performance of ITER. A diagnostic neutral beam (~100 keV) will be installed for Charge Exchange Recombination Spectroscopy. Motional Stark Effect measurements (for q profile) will be made using the heating beam (1 MeV). Diagnostic components, such as mirrors, windows, and optical fibers etc, mounted close to the plasma will experience higher levels of radiation due to neutron, gamma ray and particle irradiations than in present devices. Potentially their performance characteristics can be degraded and so the materials of the components have to be carefully selected and mitigating methods adopted where possible.
?Ling, E.*; Shirai, Koji*; Kanekatsu, Rensuke*; Kobayashi, Yasuhiko; Tu, Z.; Funayama, Tomoo; Watanabe, Hiroshi; Kiguchi, Kenji*
Journal of Insect Biotechnology and Sericology, 72(2), p.101 - 109, 2003/09
no abstracts in English
Lee, K. K.; Oshima, Takeshi; Saint, A.*; Kamiya, Tomihiro; Jamieson, D. N.*; Ito, Hisayoshi
Nuclear Instruments and Methods in Physics Research B, 210, p.489 - 494, 2003/09
Times Cited Count：21 Percentile：78.43(Instruments & Instrumentation)To obtain the information on radiation damage of 6H-SiC devices, ion beam induced charge collection (IBICC) for 6H-SiC schottky diodes irradiated with proton, alpha and carbon micro beam 10
to 10
ions/cm
was studied. No significant difference of degradation was observed between p- and n-substrates irradiated with 2MeV-alpha micro beam. The decrease in IBCC shows a good agreement with the calculation using non ionizing energy loss (NIEL). As a result of ion luminescence and ultra violet photo luminescence, the level of 2.32 eV was observed.
